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NanoSC:
Nanomaterials/Surface Characterization Facility
Facility Manager:
Eugenia Kharlampieva, PhD
(201)-934-0974,
ekharlam@uab.edu
Time scheduling:
Veronika Kozlovskaya, PhD
(201)-934-7116,
vkozlovs@uab.edu
Services and Policies:
The UAB Department of Chemistry
Nanomaterials/Surface Characterization Facility is available
to UAB researchers, government users, users from other
universities, and industrial customers.
We provide nanomaterials/surface characterization
services including consultation, data collection, and data
processing. Fees are
charged on a per-sample basis (see fee schedule).
Collaborations with university and industrial are
encouraged. Users should e-mail to book their time.
Instruments:
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Spectroscopic
ellipsometer
Woollam M2000-U (J. A.
Woollam Co., Inc.) multi-angle spectroscopic
ellipsometer (240-1000 nm spectral range) with a
CompleteEASE analysis software is used for
monitoring film thickness upon deposition and
thickness changes upon changes in the environment.
It is equipped with a 5 mL heated liquid cell. The
cell allows the user to perform ellipsometric
measurments on samples within a transparent liquid
environment over the temperature range of room to
50°C with 0.2°C precision (the cell’s angle of
incidence is 75°0. The cell can fit 50 mm diameter
silicon wafers. The sample dimensions should be
~51x14mm2.
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ZetaSizer
Zetasizer Nano (Nano ZS,
Malvern) particle analyser combines measurements of
particle size
(0.6nm
to 6μm) and zeta potential (size range for the
measurements is from 5nm to 10μm.
The instrument has
a unique feature of temperature controlled
measurements. The allowed temperature control ranges
from 0 to 90°C with 0.1°C precision. The instrument
uses a 633 nm laser. Minimum sample volume is 1 mL.
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Waters GPC-HPLC
Breeze 2 system with RI detector
Molecular weight of polymers can be characterized
(250 Da – 80,000 Da) as well as Mw/Mn
distributions.
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Optical
Tensiometer
Theta Lite Optical Tensiometer TL100 (Biolin
Scientific) is a compact computer controlled video
based instrument for the measurement of contact
angles and surface free energy (0...180°± 0.1°,
0.01...999 mN/m ±0.01°
mN/m) In surface free energy calculations, data from
Sessile Drop experiments is utilized to calculate
the surface free energy of the solid. The available
drop profiles are: sessile drop, pendant drop,
meniscus, and reverse pendant drop. Advancing and
receding contact angles can also be studied if
dispensing the liquid manually. Maximum sample size:
W unlimited x L200 x H50 mm
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FTIR
A Bruker FT-IR spectrometer (Vertex 70) is equipped
with a narrow-band mercury cadmium telluride
detector. The internal compartment of the FTIR
spectrometer is purged with dry nitrogen
to eliminate interference of water vapors.
The technique
allows for monitoring of chemical composition of
films (on KBr pellets), powders (in KBr), and
liquids.
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ATR-FTIR
(Attenuated Total Reflection Fourier Transform
Infrared Spectroscopy)
A Bruker ALPHA ATR-FTIR
spectrometer
allows for fast surface analyses of films on silicon
wafers; powders; and liquids.
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